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                NanoFocus μScan(激光扫描轮廓仪)

                NanoFocus μScan(激光扫描轮廓仪)
                <
                • NanoFocus μScan(激光扫描轮廓仪)
                >
                产品报价: 面议
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                shnti0007 (μScan)
                上海纳腾仪器有限公司
                上海
                详细说明

                NanoFocus μScan(激光扫描轮廓仪)
                AF2 自动对焦(Autofocus)

                借由探测器的回馈讯号调整物镜位置,得到待测物焦点,而获得待测物的确实高度(如下左图)。

                CF4 共轭焦(Confocal, Laser)

                激光光束经由物镜迅速上下移动聚焦于待测物上,此时偵测器能经由孔洞得到最大光的强度,如此侦测器根据此讯号确定其位置(如下右图)。

                AF2
                 
                CF4

                n         应用

                ü         集成电路封装和表面贴片技术

                ü         厚膜混合电路:膜厚度的自动化测量

                ü          精密部件

                [1] BGA        [2] thick film     [3] dispenser dots     [4] laminate
                n         技术参数

                Scan modules

                Measuring range in x,y-direction [mm]

                Resolution in x,y-direction [mm]

                Positioning range in z-direction [mm]

                Max. measuring speed [mm/s]

                SC 50

                50X50

                0.5

                100

                50

                SC 100

                100x100

                0.5

                100

                50

                SC 150

                150x150

                0.5

                100

                50

                SC 200

                200x200

                0.5

                100

                50

                other dimensions on request

                 

                Sensors

                Resolution z [μm]

                Resolution x,y [μm]

                Working distance [mm]

                Measuring range in z-direction [mm]

                Camera (optional)

                Confocal point sensor

                CF 4

                0.02

                1

                4

                1.0

                off-axis

                 

                CF 13

                0.02

                1

                13

                1.0

                (BMT5)

                Autofocus sensor

                AF 2

                0.025/0.0111)

                1

                2

                1.5/0.651)

                integrated

                AF 5

                0.025/0.0111)

                1

                5

                1.5/0.651)

                (BMT3)

                Chromatic white light sensor

                CRT 52)

                0.010

                4

                5

                0.3

                off-axis (BMT5)

                CRT 122)

                0.025

                4

                12

                1.0

                CRT 162)

                0.075

                8

                16

                3.0

                Holographic sensor

                CP 15

                3.0

                12

                12

                1.8

                integrated

                (BMT 4)

                CP 42

                6.0

                15

                42

                8.0

                CP 65

                10.0

                25

                65

                18.0

                1) with restricted measuring range 2) with 1, 4 or 30 kHz measuring frequency available

                 

                Modules

                 

                System controller

                High performance industrial PC, DVD-Writer, network card,

                Windows XP Professional

                Cabinet and work table MT 70

                Stable container for electronic modules with work table

                1550x800x750 (lxwxh in mm)

                Granite measuring stand MP 100

                Portal construction, 660x450x497 (lxwxh in mm) for SC 50 to SC 150

                Granite measuring stand MP 200

                Portal construction, 680x480x385 (lxwxh in mm) from SC 200

                NF μsoft standard software

                NanoFocus control and evaluation software, profile and topography

                representation, roughness calculation compliant with DIN EN ISO

                 

                 

                Options

                 

                NF 3D-Plus

                Photo-realistic 3D presentation of topographical data (OpenGL)

                NF Active X

                Interface modules to program individual measurement processes and

                calculations (Excel/VBA)

                NF Hybridmaster

                Automation tool for the use of μscan® in thick film production incl. SPC and

                teach in module

                NF Flatmaster

                Automated measurement of straightness, flatness and warpage

                NF Solder

                Automated off-line measurement of fine pitch solderpaste print in SMT production

                NF AutoScan

                Automated measurement of profiles and surfaces at arbitrary measurement

                points

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