| 项 目 | 指标和说明 |
| 光源 | 150W氙灯光纤输出,光学ㄨ稳定度≦0.8%，可工作在斩波模式, |
| 测试光斑尺寸 | 3mm~10mm |
| 单色仪 | 三光栅DSP扫描单色仪 |
| 波长范围 | 300nm～2000nm |
| 波长准确度 | a) ±0.3nm（1200g/mm,300nm） |
| b) ±0.6nm(600g/mm,500nm) | |
| c) ±0.8nm(300g/mm,1250nm) | |
| 扫描间隔 | 最小可至0.1nm |
| 输出波※长带宽 | <5 nm |
| 多级光谱滤除装置 | 根据波长自动切换，消除多▆级光谱的影响 |
| 光调制频率→ | 4 - 400 Hz |
| 标准■探测器 | 标配标准硅探测器，InGaAs探测器,含校正报告 |
| 偏置光源 | 150W Xenon Lamp 光纤输出 |
| 数据采集装置灵敏度 | 直流模式：100nA；交流模式：2nV |
| 测量重复精度▲① | 对太阳光谱曲线积分重复性在±1%以内 |
| 测量速度 | 单次光谱响应扫描<1min，IPCE完整测试<5min (步长5nm) |
| X Y 自动工『作台 | 300x300mm 或 500x500mm |
| 单波长 QE Mapping | 速度：20 Point/Second @ 0.5 mm Step |
| SCS10-X150-F300 | 150W Xenon arc lamp for probe source, optical stability ≦0.8%, Adjust mechanism: It can easy remove chopper from probe light |
| a) ± 0.3nm;1200g/mm, blaze 300nm (1st grating) | |
| b) ± 0.6nm;600g/mm, blaze 500nm (2nd grating) | |
| c) ± 0.8nm;300g/mm, blaze 1250nm (3rd grating) | |
| 6 Position Filter Wheel(200-2000nm) | |
| DC mode(Data Acquisition System with Pre Amplifier ) | |
| AC mode( Lock-In Amplifier ) | |
| Chopper | |
| Short current preamplifier | |
| Calibrated Si Detector | |
| Calibrated InGaAs Detector | |
| 150W Xenon Bias Light Source with fiber output, White bias light source, optical stability ≦0.8%, with 1 inch Filter Wheel | |
| XY Stage for QE Uniformity Scanning, 300mm x300mm | |
| SCS10-X150-F500 | XY Stage for QE Uniformity Scanning, 500mm x500mm |
| SCS10-T150-F300 | 150W Tungsten-Halogen Light Source instead of Xenon 150W Light Source. XY Stage for QE Uniformity Scanning, 500mm x500mm |
| SCS10-T150-F500 | 150W Tungsten-Halogen Light Source instead of Xenon 150W Light Source. XY Stage for QE Uniformity Scanning, 500mm x500mm |
