DA200S磁轭探伤仪是美国派克生产的一款交直流两用的磁粉探▂伤仪。操作简单，携带方便。用于测量表面和近表面的缺陷。
DA200S磁轭探伤仪特点：
Versatility and powerful performance in a rugged, reliable instrument
Constant AC or pulsed DC fields with the flip of a switch;
for the location of surface and some sub-surface defects
Apply continuous or residual magnetic fields and demagnetize too
Use with dry powder, wet fluorescent or visible
High impact-molded housing
One-year repair/replacement guarantee
DA200S磁轭探伤仪技术参数：The DA-200 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferro-magnetic materials. The selective AC and pulsed DC functions are built into a single reliable instrument.
The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense pulsed DC field for detection of some sub-surface defects. Combined with the flexibility of articulating legs and a rugged molded housing, the Contour Probe can be used on nearly any part or surface contour... in the lab, factory, or field site.
Your magnetic particle applications need the versatility and reliable performance advantages of the Parker Contour Probe. An industry standard with 35 years of NDT service.
SPECIFICATIONS DA200 DA200S A210 A210S
Physical 10.5" (266 mm) × 11.0" (280mm) × 2.75" (70mm)
Line Voltage Single Phase 115 VAC
50/60 Hz 230 VAC
50/60 Hz 115 VAC
50/60 Hz 230 VAC
50/60 Hz
Line Current 6 A AC/DC 4 A AC/DC 8 A AC 3 A AC
Duty Cycle 2 minutes on – 2 minutes off
Weight 13 lb (5.9 kg)
Construction Glass-filled nylon housing
10 foot (3 m) 3-wire power cord
Span 18 in. (457 mm) across poles
Field AC/DC AC/DC AC AC
