仪器介绍
The unique design of the MultiView 3000™, with its ability to combine two specialist SPM probes, makes exciting new applications possible for the first time. Examples include:
1)A specialist Thermal SPM probe can be used as a nanoheater. The second probe scanning in a different area of the sample could be used to map changes in topography, temperature or electrical resistivity.
2)A specialist NSOM probe can be used to illuminate a precise point on a sample. The second probe can then scan over a different area of the sample and map how the illumination effects the temperature or other physical properties.
3)Two NSOM probes can be used in conjunction with one another, one used for illumination while the other for collection NSOM. In this way optical scattering, absorption and transmission properties can be measured in PBGs and nanometric waveguides.
4)Two nanowire electrical probes can be combined as two electrodes. These can be scanned relative to one another over a sample, such as a semiconductor chip, to map its conductivity.
5)With two probes each one a double-wired nanoelectrode it is possible to place four electrodes in contact with the sample in a known configuration. Such an arrangement can produce SPM Hall-probes or nanometric Wheatstone bridge.
6)It is now possible for the first time to perform indentation with one probe while measuring expansion dynamics with a second probe with no need to move the sample. Alterations in thermal conductivity or electrical resistance can be measured relative to the indentations with both spatial nanometric control and microsecond time evolution.
The MultiView 3000™ supports all standard nanoindentation parameters and protocols including:
Young’s Modulus
Indentation Modulus
Indentation Creep,
Indentation Hardness
Adhesion Progressive Load
Constant Load and Multipass Scratch & Wear Tests
Force-displacement Curves
Scratch and Wear Tests with Variable Force, Rate, Length and Direction
主要特点
1）第一台独立双探针扫描的原子力显微镜；
2）探针扫描、样品扫描相结合；
3）原子力实时控制的∑Nanoindentation；
...
技术参数
扫描范围：XY方向140um、Z方向70um，另外有30um和10um扫描器选配；
扫描步进：XY方向＜5nm、Z方向＜1nm；
反馈机制：音叉反馈(resonant frequency approximately 32 KHz)； 
